Abstract; An experimental method is proposed to determine and remove the geometric component in charge pumping (CP) measurements. This method uses CP-current data of different gate length transistors (LG) with fixed gate width (WG) to obtain an empirical model for the remaining carriers in MOSFET channel after the switch off. This allows to investigate the […]
October 16, 2019 Rachid SIKADOUR 2013, Microelectronic & Nanotechnologie Division, Team CDS CP-current, geometric component, NBTI
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